Nanostructuring polymers by soft lithography templates realized via ion sputtering, Mele, E., Di Benedetto Francesca, Cingolani R., Pisignano D., Toma A., De Mongeot F.B., Buzio R., Boragno C., Firpo G., Mussi V., et al. , Nanotechnology, Volume 16, Number 11, p.2714-2717, (2005)

First evidence of tyre debris characterization at the nanoscale by focused ion beam, Milani, M., Pucillo F.P., Ballerini M., Camatini M., Gualtieri Maurizio, and Martino S. , Materials Characterization, Volume 52, Number 4-5, p.283-288, (2004)

Momentum transfer parameter in argon-assisted carbon coatings, Rizzo, A., Alvisi Marco, Sarto F., and Scaglione S. , Thin Solid Films, Volume 384, Number 2, p.215-222, (2001)

Ablation of transition metal oxides by different laser pulse duration and thin films deposition, A. Guidoni, Giardini, Flamini C., Varsano F., Ricci M., Teghil R., Marotta V., and Di Palma T.M. , Applied Surface Science, Volume 154, Strasbourg, France, p.467-472, (2000)

HfO2 films with high laser damage threshold, Alvisi, Marco, Di Giulio M., Marrone S.G., Perrone M.R., Protopapa Maria Lucia, Valentini A., and Vasanelli L. , Thin Solid Films, Volume 358, Number 1, p.250-258, (2000)

Dual ion beam sputtering coating of plastic substrates: Improvement of film/substrate adhesion by minimizing the total stress at the interface, Sarto, F., Alvisi Marco, Caneve L., AbuHassan L.H., and Scaglione S. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3738, Berlin, Ger, p.66-75, (1999)

Influence of the assisting-ion-beam parameters on the laser-damage threshold of SiO2 films, Alvisi, Marco, De Nunzio G., Perrone M.R., Rizzo A., Scaglione S., and Vasanelli L. , Thin Solid Films, Volume 338, Number 1-2, p.269-275, (1999)

Optical and mechanical properties of diamond like carbon produced by dual ion beam sputtering technique, Scaglione, Salvatore, Sarto Francesca, Pepe Raffaele, Rizzo Antonella, and Alvisi Marco , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3738, Berlin, Ger, p.58-65, (1999)

Structural and optical modification in hafnium oxide thin films related to the momentum parameter transferred by ion beam assistance, Alvisi, Marco, Scaglione S., Martelli S., Rizzo A., and Vasanelli L. , Thin Solid Films, Volume 354, Number 1, p.19-23, (1999)

The influence of ion mass and energy on the composition of IBAD oxide films, Rizzo, A., Alvisi Marco, Sarto F., Scaglione S., and Vasanelli L. , Surface and Coatings Technology, Volume 108-109, p.297-302, (1998)

Laser-induced damage thresholds of SiO2 films grown with different assistance parameters: a comparative study performed by the photoacoustic mirage technique, Alvisi, Marco, De Nunzio G., Perrone M.R., Rizzo A., Scaglione S., and Vasanelli L. , Conference on Lasers and Electro-Optics Europe - Technical Digest, Glasgow, Scotland, p.311, (1998)

Surface and interface morphology of thin oxide films investigated by X-ray reflectivity and atomic force microscopy, Alvisi, Marco, Leo G., Rizzo A., Tapfer Leander, and Vasanelli L. , Surface and Coatings Technology, Volume 100-101, Number 1-3, p.76-79, (1998)

X-ray reflectivity analysis of thin TiN and TiOxNy films deposited by dual-ion-beam sputtering on (100) Si substrates, Alvisi, Marco, Rizzo A., Tapfer Leander, and Vasanelli L. , Thin Solid Films, Volume 298, Number 1-2, p.130-134, (1997)

Structural, compositional, and optical characterization of thin TiOxNy coatings fabricated by dual ion beam sputtering, Rizzo, Antonella, Mirenghi L., Tapfer Leander, Alvisi Marco, Vasanelli L., Sarto F., and Scaglione Salvatore , Proceedings of SPIE - The International Society for Optical Engineering, Volume 2776, Glasgow, UK, p.392-399, (1996)

XPS investigation on amorphous silion nitride (a‐SiNx) chemical structure, Ingo, G.M., Zacchetti N., Della Sala Dario, and Coluzza C. , Surface and Interface Analysis, Volume 12, Number 5, p.323-324, (1988)

Dual-ion-beam sputtering technique for the production of hydrogenated amorphous silicon, Scaglione, S., Coluzza C., Della Sala Dario, Mariucci L., Frova A., and Fortunato G. , Thin Solid Films, Volume 120, Number 3, p.215-222, (1984)