Surface and interface morphology of thin oxide films investigated by X-ray reflectivity and atomic force microscopy, Alvisi, Marco, Leo G., Rizzo A., Tapfer Leander, and Vasanelli L. , Surface and Coatings Technology, Volume 100-101, Number 1-3, p.76-79, (1998)

Synthesis of silicon carbide thin films by ion beam sputtering, Valentini, A., Convertino A., Alvisi Marco, Cingolani R., Ligonzo T., Lamendola R., and Tapfer Leander , Thin Solid Films, Volume 335, Number 1-2, p.80-84, (1998)

Glancing-incidence X-ray characterization of Nb/Pd multilayers, Tagliente, M.A., Del Vecchio A., Tapfer Leander, Coccorese C., Mercaldo L., Maritato L., Slaughter J.M., and Falco C.M. , Nuovo Cimento della Societa Italiana di Fisica D - Condensed Matter, Atomic, Molecular and Chemical Physics, Biophysics, Volume 19, Number 2-4, p.473-480, (1997)

X-ray reflectivity analysis of thin TiN and TiOxNy films deposited by dual-ion-beam sputtering on (100) Si substrates, Alvisi, Marco, Rizzo A., Tapfer Leander, and Vasanelli L. , Thin Solid Films, Volume 298, Number 1-2, p.130-134, (1997)

Structural, compositional, and optical characterization of thin TiOxNy coatings fabricated by dual ion beam sputtering, Rizzo, Antonella, Mirenghi L., Tapfer Leander, Alvisi Marco, Vasanelli L., Sarto F., and Scaglione Salvatore , Proceedings of SPIE - The International Society for Optical Engineering, Volume 2776, Glasgow, UK, p.392-399, (1996)

Structural investigation of YBCO films and bicrystal grain boundary junctions, Del Vecchio, A., Camerlingo C., De Riccardis Maria Federica, Huang H., Ruggiero B., Russo M., Sarnelli E., Tagliente M.A., Tapfer Leander, and Testa G. , Il Nuovo Cimento D, Volume 16, Number 12, p.2025-2030, (1994)

X-ray diffraction analysis fo GaAs/AlAs multilayer structures grown by molecular beam epitaxy on (311) and (210) GaAs surfaces, Tagliente, M.A., De Caro L., Tapfer Leander, Nötzel R., Fischer A., and Ploog K. , Solid State Electronics, Volume 37, Number 4-6, p.747-751, (1994)