Produzione Scientifica
Found 2 results
Filters: Keyword is X ray diffraction and Author is Prete, P. [Clear All Filters]
Morphology and microstructure of core-shell GaAs/GaxAl1-xAs nanowires investigated by He-ion microscopy and X-ray reciprocal space mapping,
, Materials Research Society Symposium Proceedings, Volume 1707, (2014)
Structural characterization of ZnSe/ZnMgSe MQWs grown on (1 0 0)GaAs by low pressure MOVPE,
, Journal of Crystal Growth, Volume 248, Number SUPPL., Berlin, p.56-61, (2003)