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Produzione Scientifica

Found 3 results
Filters: Author is Perrone, M.R. and Keyword is X ray diffraction analysis  [Clear All Filters]
2002
Influence of standing-wave electric field pattern on the laser damage resistance of HfO2 thin films, Protopapa, Maria Lucia, Alvisi Marco, de Tomasi F., Di Giulio M., Perrone M.R., and Scaglione S. , Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films, Volume 20, Number 3, p.643-650, (2002)
Ion assistance effects on electron beam deposited MgF2 films, Alvisi, Marco, de Tomasi F., A. Patria Della, Di Giulio M., Masetti E., Perrone M.R., Protopapa Maria Lucia, and Tepore A. , Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films, Volume 20, Number 3, p.714-720, (2002)
2000
Correlation between the structural and optical properties of ion assisted afnia thin films, Scaglione, Salvatore, Sarto Francesca, Alvisi Marco, Rizzo Antonella, Perrone M.R., and Protopapa Maria Lucia , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3902, Boulder, CO, USA, p.194-203, (2000)