Produzione Scientifica
Found 3 results
Filters: Author is Perrone, M.R. and Keyword is X ray diffraction analysis [Clear All Filters]
Influence of standing-wave electric field pattern on the laser damage resistance of HfO2 thin films,
, Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films, Volume 20, Number 3, p.643-650, (2002)
Ion assistance effects on electron beam deposited MgF2 films,
, Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films, Volume 20, Number 3, p.714-720, (2002)
Correlation between the structural and optical properties of ion assisted afnia thin films,
, Proceedings of SPIE - The International Society for Optical Engineering, Volume 3902, Boulder, CO, USA, p.194-203, (2000)