Produzione Scientifica
Found 3 results
Filters: Author is Scaglione, S. and Keyword is X ray diffraction analysis [Clear All Filters]
Influence of standing-wave electric field pattern on the laser damage resistance of HfO2 thin films,
, Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films, Volume 20, Number 3, p.643-650, (2002)
Structural and optical properties of silver thin films deposited by RF magnetron sputtering,
, Thin Solid Films, Volume 396, Number 1-2, p.29-35, (2001)
Structural and optical modification in hafnium oxide thin films related to the momentum parameter transferred by ion beam assistance,
, Thin Solid Films, Volume 354, Number 1, p.19-23, (1999)