Produzione scientifica
Found 8 results
Filtri: Parola Chiave is Ion beams and Autore is Vasanelli, L. [Clear All Filters]
HfO2 films with high laser damage threshold,
, Thin Solid Films, Volume 358, Number 1, p.250-258, (2000)
Influence of the assisting-ion-beam parameters on the laser-damage threshold of SiO2 films,
, Thin Solid Films, Volume 338, Number 1-2, p.269-275, (1999)
Structural and optical modification in hafnium oxide thin films related to the momentum parameter transferred by ion beam assistance,
, Thin Solid Films, Volume 354, Number 1, p.19-23, (1999)
The influence of ion mass and energy on the composition of IBAD oxide films,
, Surface and Coatings Technology, Volume 108-109, p.297-302, (1998)
Laser-induced damage thresholds of SiO2 films grown with different assistance parameters: a comparative study performed by the photoacoustic mirage technique,
, Conference on Lasers and Electro-Optics Europe - Technical Digest, Glasgow, Scotland, p.311, (1998)
Surface and interface morphology of thin oxide films investigated by X-ray reflectivity and atomic force microscopy,
, Surface and Coatings Technology, Volume 100-101, Number 1-3, p.76-79, (1998)
X-ray reflectivity analysis of thin TiN and TiOxNy films deposited by dual-ion-beam sputtering on (100) Si substrates,
, Thin Solid Films, Volume 298, Number 1-2, p.130-134, (1997)
Structural, compositional, and optical characterization of thin TiOxNy coatings fabricated by dual ion beam sputtering,
, Proceedings of SPIE - The International Society for Optical Engineering, Volume 2776, Glasgow, UK, p.392-399, (1996)