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Radiation-enhanced diffusion in amorphous Ni-Zr studied by in situ electron irradiation in a transmission electron microscope

TitleRadiation-enhanced diffusion in amorphous Ni-Zr studied by in situ electron irradiation in a transmission electron microscope
Publication TypeArticolo su Rivista peer-reviewed
Year of Publication1994
AuthorsBellini, S., Montone Amelia, and Vittori-Antisari M.
JournalPhysical Review B
Volume50
Pagination9803-9809
ISSN01631829
Abstract

Radiation-enhanced diffusion (RED) in a Ni-Zr metallic glass has been studied by high-energy electron irradiation performed in situ in a transmission electron microscope. Irradiations have been carried out on thin foil cross-sectional specimens obtained from Ni-Zr bulk diffusion couples. The diffusivity under electron irradiation has been derived from the growth rate of a thin Ni-Zr amorphous film present at the Ni-Zr interface. Experimental results show that the Ni is the most mobile species in these experimental conditions and that radiation damage occurs in glassy metals at a lower electron energy relative to the corresponding crystalline compound. Moreover, the dose-rate sensitivity of RED appears to depend also on the energy of the electron beam. To explain this effect, the process of radiation displacement in metallic glasses has been modeled within the framework of the free-volume theory of the structure of metallic glasses. The results of this simple model can qualitatively explain our results as well as those relative to RED induced by high-energy ion irradiation. © 1994 The American Physical Society.

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URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-3042943128&doi=10.1103%2fPhysRevB.50.9803&partnerID=40&md5=5da7e9bf958c809982d5e4531564ed06
DOI10.1103/PhysRevB.50.9803
Citation KeyBellini19949803