Influence of the standing wave electric field pattern on the laser damage resistance of HfO2 thin films, Alvisi, Marco, Di Giulio M., Perrone M.R., Protopapa Maria Lucia, and Scaglione S. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 4347, Boulder, CO, p.102-107, (2001)

Laser damage studies on MgF2 thin films, Protopapa, Maria Lucia, de Tomasi F., Perrone M.R., Piegari A., Masetti E., Ristau D., Quesnel E., and Duparre A. , Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films, Volume 19, Number 2, p.681-688, (2001)

HfO2 films with high laser damage threshold, Alvisi, Marco, Di Giulio M., Marrone S.G., Perrone M.R., Protopapa Maria Lucia, Valentini A., and Vasanelli L. , Thin Solid Films, Volume 358, Number 1, p.250-258, (2000)

Laser damage threshold of MgF2 thin films by photoacoustic beam deflection, Protopapa, Maria Lucia, Perrone M.R., Piegari A., Masetti E., Ristau D., Quesnel E., and Duparre A. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3902, Boulder, CO, USA, p.175-181, (2000)

Influence of the assisting-ion-beam parameters on the laser-damage threshold of SiO2 films, Alvisi, Marco, De Nunzio G., Perrone M.R., Rizzo A., Scaglione S., and Vasanelli L. , Thin Solid Films, Volume 338, Number 1-2, p.269-275, (1999)

Laser damage testing of SiO2 and HfO2 thin films, Di Giulio, M., Alvisi Marco, Perrone M.R., Protopapa Maria Lucia, Valentini A., and Vasanelli L. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3738, Berlin, Ger, p.337-346, (1999)