Antibacterial Al-doped ZnO coatings on PLA films, Valerini, D., Tammaro Loredana, Villani Fulvia, Rizzo A., Caputo I., Paolella G., and Vigliotta G. , Journal of Materials Science, Volume 55, Number 11, p.4830-4847, (2020)

Aluminum-doped zinc oxide coatings on polylactic acid films for antimicrobial food packaging, Valerini, D., Tammaro Loredana, Di Benedetto Francesca, Vigliotta G., Capodieci Laura, Terzi R., and Rizzo A. , Thin Solid Films, Volume 645, p.187-192, (2018)

Nanostructured Al-doped ZnO coatings on PLA films for food packaging applications, Valerini, D., Tammaro Loredana, Di Benedetto Francesca, Capodieci Laura, Terzi R., and Rizzo A. , 2015 1st Workshop on Nanotechnology in Instrumentation and Measurement, NANOFIM 2015, p.207-211, (2018)

Properties of ZrNx films with x > 1 deposited by reactive radiofrequency magnetron sputtering, Rizzo, A., Signore M.A., Mirenghi L., and Serra Emanuele , Thin Solid Films, Volume 515, Number 4, p.1307-1313, (2006)

Momentum transfer parameter in argon-assisted carbon coatings, Rizzo, A., Alvisi Marco, Sarto F., and Scaglione S. , Thin Solid Films, Volume 384, Number 2, p.215-222, (2001)

Dependence of the HfO2 thin film structure on the momentum transfer in ion beam assisted deposition, Scaglione, S., Sarto F., Rizzo A., and Alvisi Marco , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3578, Boulder, CO, USA, p.154-161, (1999)

Influence of the assisting-ion-beam parameters on the laser-damage threshold of SiO2 films, Alvisi, Marco, De Nunzio G., Perrone M.R., Rizzo A., Scaglione S., and Vasanelli L. , Thin Solid Films, Volume 338, Number 1-2, p.269-275, (1999)

Structural and optical modification in hafnium oxide thin films related to the momentum parameter transferred by ion beam assistance, Alvisi, Marco, Scaglione S., Martelli S., Rizzo A., and Vasanelli L. , Thin Solid Films, Volume 354, Number 1, p.19-23, (1999)

Structural and optical properties of zinc selenide thin films deposited by RF magnetron sputtering, Rizzo, A., Caneve L., Scaglione S., and Tagliente M.A. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3738, Berlin, Ger, p.40-47, (1999)

Surface and interface morphology of thin oxide films investigated by X-ray reflectivity and atomic force microscopy, Alvisi, Marco, Leo G., Rizzo A., Tapfer Leander, and Vasanelli L. , Surface and Coatings Technology, Volume 100-101, Number 1-3, p.76-79, (1998)

X-ray reflectivity analysis of thin TiN and TiOxNy films deposited by dual-ion-beam sputtering on (100) Si substrates, Alvisi, Marco, Rizzo A., Tapfer Leander, and Vasanelli L. , Thin Solid Films, Volume 298, Number 1-2, p.130-134, (1997)