Produzione scientifica
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Filtri: Parola Chiave is Ion beams and Autore is Coluzza, C. [Clear All Filters]
XPS investigation on amorphous silion nitride (a‐SiNx) chemical structure,
, Surface and Interface Analysis, Volume 12, Number 5, p.323-324, (1988)
Dual-ion-beam sputtering technique for the production of hydrogenated amorphous silicon,
, Thin Solid Films, Volume 120, Number 3, p.215-222, (1984)