Produzione scientifica
Found 24 results
Filtri: Parola Chiave is Excimer lasers [Clear All Filters]
Excimer laser induced crystallization of amorphous silicon on flexible polymer substrates,
, Thin Solid Films, Volume 487, Number 1-2, p.58-62, (2005)
Tin oxide thin films prepared by laser-assisted metal - Organic CVD: Structural and gas sensing properties,
, Surface and Coatings Technology, Volume 200, Number 1-4 SPEC. ISS., p.1057-1060, (2005)
High mechanical damage resistant sol-gel coating for high power lasers,
, Proceedings of SPIE - The International Society for Optical Engineering, Volume 5250, St. Etienne, p.537-545, (2004)
Laser-induced damage measurements on phase-unifying mirrors for XeF excimer laser cavities,
, Proceedings of SPIE - The International Society for Optical Engineering, Volume 5250, St. Etienne, p.656-662, (2004)
Electronic materials via laser radiation,
, Proceedings of SPIE - The International Society for Optical Engineering, Volume 5120, Wroclaw, p.564-576, (2003)
Low-temperature laser-CVD thin film growth of SiC from Si2H 6 and C2H2,
, Journal of Crystal Growth, Volume 258, Number 3-4, p.272-276, (2003)
Phase-unifying mirrors for high-power XeF excimer lasers,
, Applied Physics Letters, Volume 82, Number 12, p.1809-1811, (2003)
Evolution of the beam quality factor for various active medium positions within a Gaussian cavity,
, Optics Communications, Volume 195, Number 5-6, p.315-325, (2001)
Laser damage dependence on structural and optical properties of ion-assisted HfO2 thin films,
, Thin Solid Films, Volume 396, Number 1-2, p.44-52, (2001)
Laser damage studies on MgF2 thin films,
, Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films, Volume 19, Number 2, p.681-688, (2001)
Stimulated rotational and vibrational Raman scattering by elliptical polarized pump radiation,
, Physical Review A. Atomic, Molecular, and Optical Physics, Volume 64, Number 2, p.023812/1-023812/8, (2001)
Effects of structural properties and electric field distribution on the laser-damage threshold of HfO2 thin films,
, Proceedings of SPIE - The International Society for Optical Engineering, Volume 4070, Potenza-Lecce, Italy, p.380-386, (2000)
Experimental results on silicon annealing by a long-pulse, high-power XeCl laser system,
, Proceedings of SPIE - The International Society for Optical Engineering, Volume 4070, Potenza-Lecce, Italy, p.345-350, (2000)
Fine trimming of SmS film resistance by XeCl laser ablation,
, Thin Solid Films, Volume 359, Number 2, p.251-254, (2000)
Laser damage resistance of thin films for ultraviolet optical components,
, Proceedings of SPIE - The International Society for Optical Engineering, Volume 4430, Number 1, p.869-881, (2000)
Novel two-pass excimer laser crystallization process to obtain homogeneous large grain polysilicon,
, Materials Research Society Symposium - Proceedings, Volume 558, San Francisco, CA, USA, p.175-186, (2000)
Single shot laser damage in ultraviolet mirrors with a stepwise reflectivity profile,
, Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Volume 18, Number 2, p.477-484, (2000)
Solar blind lidar for continuous monitoring of water vapour,
, Proceedings of SPIE - The International Society for Optical Engineering, Volume 4070, Potenza-Lecce, Italy, p.108-113, (2000)
Ultraviolet-graded coatings for lasers: Surface optical performance,
, Thin Solid Films, Volume 373, Number 1-2, p.155-158, (2000)
Beam width measurements of asymmetric multi-mode laser beams,
, Optics and Laser Technology, Volume 31, Number 6, p.411-418, (1999)
Daytime Raman LIDAR for vertical profiling of water vapour and Ozone,
, Proceedings of SPIE - The International Society for Optical Engineering, Volume 3867, Florence, Italy, p.228-233, (1999)
Grain boundary location control by patterned metal film in excimer laser crystallized polysilicon,
, Diffusion and Defect Data Pt.B: Solid State Phenomena, Volume 67, Schwabisch Gmund, Ger, p.175-180, (1999)
Laser damage testing of SiO2 and HfO2 thin films,
, Proceedings of SPIE - The International Society for Optical Engineering, Volume 3738, Berlin, Ger, p.337-346, (1999)
Two-pass excimer laser annealing process to control amorphous silicon crystallization,
, Japanese Journal of Applied Physics, Part 2: Letters, Volume 38, Number 8 B, p.L907-L910, (1999)