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Structural investigation of YBCO films and bicrystal grain boundary junctions

TitoloStructural investigation of YBCO films and bicrystal grain boundary junctions
Tipo di pubblicazioneArticolo su Rivista peer-reviewed
Anno di Pubblicazione1994
AutoriDel Vecchio, A., Camerlingo C., De Riccardis Maria Federica, Huang H., Ruggiero B., Russo M., Sarnelli E., Tagliente M.A., Tapfer Leander, and Testa G.
RivistaIl Nuovo Cimento D

We present a structural analysis of YBCO superconducting thin films fabricated in situ by Inverted Cylindrical Magnetron (ICM) sputtering on commercial SrTiO3 single-crystal and bicrystal substrates. A detailed structural characterization of the superconductor films was performed by using single-crystal X-ray diffractometry confirming that YBCO films have a strong c-axis orientation of the grains with a small mosaic spread. In the films grown on bicrystal substrates we observed a strong correlation with the lattice structure of the substrate. In addition, a surface analysis of the region across the grain boundary edge has been performed by using scanning electron microscopy. © 1994 Società Italiana di Fisica.


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Citation KeyDelVecchio19942025