| Titolo | Microstructural characterization of SiC-SiC joint by Raman spectroscopy |
|---|---|
| Tipo di pubblicazione | Articolo su Rivista peer-reviewed |
| Anno di Pubblicazione | 2004 |
| Autori | Magnani, G., Brillante A., Farina L., and Beaulardi L. |
| Rivista | Journal of the American Ceramic Society |
| Volume | 87 |
| Paginazione | 651-655 |
| ISSN | 00027820 |
| Parole chiave | Brazing, Composition, Crystal growth, Crystal microstructure, Crystal structure, Crystal symmetry, Crystallization, Density (specific gravity), Mixtures, Neutral density filters, Phase transitions, Raman microspectrometers, Raman spectroscopy, Scanning electron microscopy, Silicon carbide |
| Abstract | Analysis of the SiC-SiC joint and its brazing mixture has been performed using a Raman spectroscopy microprobe technique. A careful mapping of the sample clearly shows the spatial distribution of the chemical species close to and within the joint. A different distribution of the 4H and 6H α-SiC polytypes, grown during the brazing process, was observed inside the joint. The furthermore, identification of the bands related to the Nowotny phase was also possible. |
| Note | cited By 1 |
| URL | https://www.scopus.com/inward/record.uri?eid=2-s2.0-2342504588&partnerID=40&md5=30a2c5b9323d69f8a87e273a11e42418 |
| Citation Key | Magnani2004651 |
