Influence of standing-wave electric field pattern on the laser damage resistance of HfO2 thin films, Protopapa, Maria Lucia, Alvisi Marco, de Tomasi F., Di Giulio M., Perrone M.R., and Scaglione S. , Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films, Volume 20, Number 3, p.643-650, (2002)

Dependence of the HfO2 thin film structure on the momentum transfer in ion beam assisted deposition, Scaglione, S., Sarto F., Rizzo A., and Alvisi Marco , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3578, Boulder, CO, USA, p.154-161, (1999)

Laser-induced damage thresholds of SiO2 films grown with different assistance parameters: a comparative study performed by the photoacoustic mirage technique, Alvisi, Marco, De Nunzio G., Perrone M.R., Rizzo A., Scaglione S., and Vasanelli L. , Conference on Lasers and Electro-Optics Europe - Technical Digest, Glasgow, Scotland, p.311, (1998)