Produzione scientifica
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Filtri: Parola Chiave is Refractive index and Autore is Rizzo, A. [Clear All Filters]
Dependence of the HfO2 thin film structure on the momentum transfer in ion beam assisted deposition,
, Proceedings of SPIE - The International Society for Optical Engineering, Volume 3578, Boulder, CO, USA, p.154-161, (1999)
Laser-induced damage thresholds of SiO2 films grown with different assistance parameters: a comparative study performed by the photoacoustic mirage technique,
, Conference on Lasers and Electro-Optics Europe - Technical Digest, Glasgow, Scotland, p.311, (1998)