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Produzione scientifica

Found 2 results
Filtri: Parola Chiave is Refractive index and Autore is Rizzo, A.  [Clear All Filters]
1999
Dependence of the HfO2 thin film structure on the momentum transfer in ion beam assisted deposition, Scaglione, S., Sarto F., Rizzo A., and Alvisi Marco , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3578, Boulder, CO, USA, p.154-161, (1999)