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Filtri: Parola Chiave is X ray reflectivity [Clear All Filters]
Experimental check of the use of unconventional reference materials for EDS analysis in a TEM by extrapolation method based on pure elements,
, IOP Conference Series: Materials Science and Engineering, Volume 32, Number 1, Angers, (2012)
Surface and interface morphology of thin oxide films investigated by X-ray reflectivity and atomic force microscopy,
, Surface and Coatings Technology, Volume 100-101, Number 1-3, p.76-79, (1998)
X-ray reflectivity analysis of thin TiN and TiOxNy films deposited by dual-ion-beam sputtering on (100) Si substrates,
, Thin Solid Films, Volume 298, Number 1-2, p.130-134, (1997)