Dependence of the HfO2 thin film structure on the momentum transfer in ion beam assisted deposition, Scaglione, S., Sarto F., Rizzo A., and Alvisi Marco , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3578, Boulder, CO, USA, p.154-161, (1999)

Laser damage testing of SiO2 and HfO2 thin films, Di Giulio, M., Alvisi Marco, Perrone M.R., Protopapa Maria Lucia, Valentini A., and Vasanelli L. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3738, Berlin, Ger, p.337-346, (1999)