Analysis of data from various indentation techniques for thin films intrinsic hardness modelling, Chicot, D., Bemporad E., Galtieri G., Roudet F., Alvisi Marco, and Lesage J. , Thin Solid Films, Volume 516, Number 8, p.1964-1971, (2008)

RF sputtering deposition of alternate TiN/ZrN multilayer hard coatings, Rizzo, A., Signore M.A., Penza Michele, Tagliente M.A., De Riccardis Maria Federica, and Serra Emanuele , Thin Solid Films, Volume 515, Number 2 SPEC. ISS., p.500-504, (2006)

On the influence of carbon implantation on the structural properties of hard TiN coatings studied by glancing incidence X-ray diffraction, Tagliente, M.A., Falcone R., Mello D., Esposito C., and Tapfer Leander , Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Volume 179, Number 1, p.42-54, (2001)

X-ray reflectivity analysis of thin TiN and TiOxNy films deposited by dual-ion-beam sputtering on (100) Si substrates, Alvisi, Marco, Rizzo A., Tapfer Leander, and Vasanelli L. , Thin Solid Films, Volume 298, Number 1-2, p.130-134, (1997)